November 7, 2019
1:45PM - 2:45PM
Math Building 317
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2019-11-07 14:45:00
2019-11-07 15:45:00
Topology Seminar- Noelle Sawyer
Title: Partial marked length spectrum rigidity for negatively curved surfaces
Speaker: Noelle Sawyer - Wesleyan University
Abstract: The marked length spectrum of a metric on a compact Riemannian manifold records the length of the shortest closed curve in each free homotopy class. It is known that a negatively curved metric on a compact Riemannian manifold is uniquely determined by its marked length spectrum up to isometry. My results show that under certain conditions on the excluded homotopy classes, a partial marked length spectrum also uniquely determines such a metric.
Math Building 317
OSU ASC Drupal 8
ascwebservices@osu.edu
America/New_York
public
Date Range
Add to Calendar
2019-11-07 13:45:00
2019-11-07 14:45:00
Topology Seminar- Noelle Sawyer
Title: Partial marked length spectrum rigidity for negatively curved surfaces
Speaker: Noelle Sawyer - Wesleyan University
Abstract: The marked length spectrum of a metric on a compact Riemannian manifold records the length of the shortest closed curve in each free homotopy class. It is known that a negatively curved metric on a compact Riemannian manifold is uniquely determined by its marked length spectrum up to isometry. My results show that under certain conditions on the excluded homotopy classes, a partial marked length spectrum also uniquely determines such a metric.
Math Building 317
Department of Mathematics
math@osu.edu
America/New_York
public
Title: Partial marked length spectrum rigidity for negatively curved surfaces
Speaker: Noelle Sawyer - Wesleyan University
Abstract: The marked length spectrum of a metric on a compact Riemannian manifold records the length of the shortest closed curve in each free homotopy class. It is known that a negatively curved metric on a compact Riemannian manifold is uniquely determined by its marked length spectrum up to isometry. My results show that under certain conditions on the excluded homotopy classes, a partial marked length spectrum also uniquely determines such a metric.